Light microscopy to 1000x for transparent, thin materials
Fluorescence microscopy to 1000x for transparent, thin, fluorescent or fluorescently-labeled materials
Nikon C1Si multi-spectral laser scanning confocal microscopy, provides the ability to precisely localize tagged molecules and inherent fluorescence in thick materials by eliminating out-of-focus information.
Transmission electron microscopy to 250,000x for ultra-thin sections of materials.
Scanning electron microscopy to 50,000x for coated and native materials secondary electron detector backscattered electron detector X-ray microanalysis.
Scanning probe atomic force microscopy nm resolution, similar to TEM z-information wide range of sample types, measurement modes
Full range of support equipment for sample preparation