• Light microscopy to 1000x for transparent, thin materials
  
  
• Fluorescence microscopy to 1000x for transparent, thin, fluorescent or fluorescently-labeled materials
  
  
• Nikon C1Si multi-spectral laser scanning confocal microscopy, provides the ability to precisely localize tagged molecules and inherent fluorescence in thick materials by eliminating out-of-focus information.
  
  
• Transmission electron microscopy to 250,000x for ultra-thin sections of materials.
  
  
• Scanning electron microscopy to 50,000x for coated and native materials secondary electron detector backscattered electron detector X-ray microanalysis.
  
  
• Scanning probe atomic force microscopy nm resolution, similar to TEM z-information wide range of sample types, measurement modes
  
  
• Full range of support equipment for sample preparation