What we do:

• Light microscopy to 1000x for transparent, thin materials

• Fluorescence microscopy to 1000x for transparent, thin, fluorescent or fluorescently-labeled materials

• Nikon C1Si multi-spectral laser scanning confocal microscopy, provides the ability to precisely localize tagged molecules and inherent fluorescence in thick materials by eliminating out-of-focus information. 

• Transmission electron microscopy to 400,000x for ultra-thin sections of materials

• Scanning electron microscopy to 300,000x for coated and native materials secondary electron detector backscattered electron detector X-ray microanalysis

• Scanning probe atomic force microscopy nm resolution, similar to TEM z-information wide range of sample types, measurement modes

• Full range of support equipment for sample preparation